E.R. Ooms

Relation between yield and reliability of integrated circuits: experimental results and application to continuous early failure rate reduction programs

F.G. Kuper, J. van der Pol, E.R. Ooms et al. · 1996 · 62 citations

Engineering, Industrial Engineering, Wafer Fab +19

Impact of screening of latent defects at electrical test on the yield-reliability relation and application to burn-in elimination

J.A. van der Pol, E.R. Ooms, T. Van 't Hof et al. · 1998 · 44 citations

Latent Defects, Engineering, Electrical Test +16

Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability ERA

J.A. van der Pol, F.G. Kuper, E.R. Ooms · Microelectronics Reliability · 1996 · 29 citations

Reliability, Electrical Engineering, Reliability Engineering +11

Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability era

J.A. van der Pol, F.G. Kuper, E.R. Ooms · 2005 · 16 citations

Engineering, Failure Rate Assessment, Ppm Reliability Era +16

Wire bonding the future: a combined experimental and numerical approach to improve the Cu-wire bonding quality

E. Spaan, E.R. Ooms, W.D. van Driel et al. · 2010 · 14 citations

Materials Engineering, Materials Science, Electrical Engineering +14