Concepedia

Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability ERA

J.A. van der Pol, F.G. Kuper, E.R. Ooms

Microelectronics Reliability · 1996 · 29 citations · 4 references

DOI

Concepts

References

4

Evolution of VLSI reliability engineering

Dwight L. Crook · 2002 · 74 citations

, , +15

Relation between yield and reliability of integrated circuits: experimental results and application to continuous early failure rate reduction programs

F.G. Kuper, J. van der Pol, E.R. Ooms et al. · 1996 · 62 citations

, , +11

Reliability defect detection and screening during processing-theory and implementation

H.H. Huston, Cathy Clarke · 1992 · 50 citations

, , +17

Reliability, yield and quality correlation for a particular failure mechanism

James Prendergast · 1993 · 24 citations

, , +16