Dwight L. Crook

Method of Determining Reliability Screens for Time Dependent Dielectric Breakdown

Dwight L. Crook · Reliability physics · 1979 · 169 citations

Engineering, Reliability Engineering, Systems Engineering +18

Evolution of VLSI reliability engineering

Dwight L. Crook · 2002 · 74 citations

Engineering, Vlsi Design, Measurement +19

Breakdown Energy of Metal (BEM) - A New Technique for Monitoring Metallization Reliability at Wafer Level

Charles C. Hong, Dwight L. Crook · Reliability physics · 1985 · 43 citations

Engineering, Mechanical Engineering, Ramp Current Stress +20

Model for Oxide Wearout Due to Charge Trapping

William K. Meyer, Dwight L. Crook · Reliability physics · 1983 · 28 citations

Materials Engineering, Electrical Engineering, Engineering +11

Evolution of VLSI Reliability Engineering

Dwight L. Crook · Reliability physics · 1990 · 27 citations

Engineering, Vlsi Design, Computer Architecture +16