Transient voltage overshoot in TLP testing – Real or artifact?

Very fast transmission line pulsing of integrated structures and the charged device model

Horst Gieser, Markus Haunschild · IEEE Transactions on Components Packaging and Manufacturing Technology Part C · 1998 · 122 citations

Engineering, Electrical Engineering, Physics +17

TLP measurements for verification of ESD protection device response

H. Hyatt, James S. Harris, A. Alanzo et al. · 2002 · 21 citations

Engineering, Electrical Engineering, Instrumentation +9

Extraction of time dependent data from time domain reflection transmission line pulse measurements [ESD protection design]

R.A. Ashton · 2005 · 15 citations

Engineering, Electrical Engineering, Instrumentation +13

Design Guidelines to Achieve a Very High ESD Robustness in a Self-Biased NPN

David Trémouilles, Marise Bafleur, Nicolas Nolhier et al. · 2009 · 11 citations

Engineering, Electrical Engineering, Microelectronics +11