Nicolas Nolhier

Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology

Géraldine Bertrand, C. Delage, M. Bafleur et al. · IEEE Journal of Solid-State Circuits · 2001 · 39 citations

Tlp Stress, Engineering, Glow Discharge +17

ESD failure signature in capacitive RF MEMS switches

Jiangjun Ruan, G. Papaioannou, Nicolas Nolhier et al. · Microelectronics Reliability · 2008 · 27 citations

Electrical Engineering, Engineering, Circuit Reliability +5

Temperature control in a rapid thermal processor

J.-M. Dilhac, C. Ganibal, J. Bordeneuve et al. · IEEE Transactions on Electron Devices · 1992 · 26 citations

Flow Control, Engineering, Computer Architecture +21

Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet et al. · IEEE Transactions on Instrumentation and Measurement · 2021 · 25 citations · Full text

Microstrip Line, Near-field Scan, Engineering +22

Electrostatic discharge failure analysis of capacitive RF MEMS switches

Jiangjun Ruan, Nicolas Nolhier, Marise Bafleur et al. · Microelectronics Reliability · 2007 · 24 citations

Electrical Engineering, Engineering, Time-dependent Dielectric Breakdown +3