Fabrice Caignet - Concepedia

Author

Fabrice Caignet

Laboratoire d'Analyse et d'Architecture des Systèmes ORCID

Also Known As

Caignet, Fabrice, Duchamp, Genevieve, F. Caignet, F. Caigneť, Fabrice Caignet, Jean-Luc Levant

Publications

623

Citations

H-Index

Concepts

All Affiliations

Laboratoire d'Analyse et d'Architecture des Systèmes Centre National de la Recherche Scientifique Institut National des Sciences Appliquées de Toulouse Université Fédérale de Toulouse Midi-Pyrénées Université Toulouse III - Paul Sabatier

About

Fabrice Caignet is an author at Laboratoire d'Analyse et d'Architecture des Systèmes specializing in engineering, electrical engineering, and computer engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	16	452
2	Electrical Engineering	12	16	452
3	Computer Engineering	11	14	427
4	Education	5	5	79
5	Applied Physics	1	1	148

Fabrice Caignet

Publications

522

Citations

H-Index

Page 1

	Year	Citations
The challenge of signal integrity in deep-submicrometer CMOS technology Fabrice Caignet, S. Delmas-Bendhia, Étienne Sicard Proceedings of the IEEE Signal Integrity CharacterizationEngineeringVlsi DesignAnalog DesignInterconnect (Integrated Circuits)	2001	148
Multisource and Battery-Free Energy Harvesting Architecture for Aeronautics Applications Claude Vanhecke, Laurent Assouère, Wang An-qing, IEEE Transactions on Power Electronics EngineeringWireless Sensor SystemEnergy EfficiencyEnergy ConversionAeronautics Applications	2014	56
Performance constraints for onchip optical interconnects J. Collet, Fabrice Caignet, F. Sellaye, IEEE Journal of Selected Topics in Quantum Electronics Optical MaterialsEngineeringDevice IntegrationIntegrated PhotonicsChip Level	2003	41
On-chip sampling in CMOS integrated circuits S. Delmas-Bendhia, Fabrice Caignet, Étienne Sicard, IEEE Transactions on Electromagnetic Compatibility Electrical EngineeringEngineeringVlsi DesignTiming AnalysisMixed-signal Integrated Circuit	1999	26
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, IEEE Transactions on Instrumentation and Measurement Microstrip LineNear-field ScanEngineeringRadio FrequencyMeasurement	2021	25
Investigation of Modeling System ESD Failure and Probability Using IBIS ESD Models Nicolas Monnereau, Fabrice Caignet, Nicolas Nolhier, IEEE Transactions on Device and Materials Reliability EngineeringSusceptibility FailureSystem ReliabilityPower ElectronicsElectromagnetic Compatibility	2012	21
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation Nicolas Monnereau, Fabrice Caignet, David Trémouilles Microelectronics Reliability	2012	20
A new method for measuring signal integrity in CMOS ICs S. Delmas-Bendhia, Fabrice Caignet, Étienne Sicard Microelectronics International EngineeringMeasurementAnalog DesignEducationIntegrated Circuits	2000	18
Investigation on ESD Transient Immunity of Integrated Circuits Nicolas Lacrampe, Ali Alaeldine, Fabrice Caignet, EngineeringIntegrated CircuitsElectromagnetic CompatibilityHardware SecurityElectrostatic Discharge	2007	18
Behavioral-Modeling Methodology to Predict Electrostatic-Discharge Susceptibility Failures at System Level : an IBIS Improvement Nicolas Monnereau, Fabrice Caignet, Nicolas Nolhier, HAL (Le Centre pour la Communication Scientifique Directe)	2011	17

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