Wafer fusion: materials issues and device results

A. Black, Aaron R. Hawkins, N.M. Margalit, D.I. Babic, A.L. Holmes, Ying‐Lan Chang, Pierre Abraham, John E. Bowers, Evelyn L. Hu

IEEE Journal of Selected Topics in Quantum Electronics · 1997 · 143 citations · 36 references

Concepts

Abstract

A large number of novel devices have been recently demonstrated using wafer fusion to integrate materials with different lattice constants. In many cases, devices created using this technique have shown dramatic improvements over those which maintain a single lattice constant. We present device results and characterizations of the fused interface between several groups of materials.

References

36