Applied Physics Letters · 1990 · 186 citations · 10 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsIntegrated Circuit DevicesIntegrated Circuit FabricationLight-emitting DiodesOptoelectronic DevicesSemiconductor Device MaterialsSemiconductor HeterostructuresCurrent-voltage RelationsDevice FabricationDevice PackagingDiode Current-voltage CharacteristicsJunction FabricationThermal ExpansionWafer DicingWafer Materials
Centimeter-size single-crystal InP or GaAs wafers have been fused together entirely, face to face or side by side, after a heat treatment in a graphite/quartz reactor which can press the wafers together through differential thermal expansion. Diodes formed by fusing p- and n-type wafers showed normal current-voltage characteristics and light emission. Fusion between lattice-mismatched wafers (i.e., InP and GaAs) has also been demonstrated.
10
American Institute of Physics Handbook
Irving E. Dayton · American Journal of Physics · 1964 · 3K citations