Simple method for estimating neutron-induced soft error rates based on modified BGR model

Y. Tosaka, H. Kanata, Shuichi Satoh, Toru Itakura

IEEE Electron Device Letters · 1999 · 46 citations · 15 references

Concepts

Abstract

Recently the importance of cosmic ray neutron-induced soft errors has been recognized. We propose a simple model to estimate the neutron-induced soft error rates (SER's), which is a modified version of the burst generation rate (BGR) model. Our model can be used to easily and quickly estimate neutron-induced soft error rates and provides a useful guideline for device and circuit engineers to estimate neutron-induced soft errors (SE's),.

References

15