IEEE Electron Device Letters · 1998 · 21 citations · 7 references
EngineeringElectrical EngineeringMicroelectronicsPower ElectronicsSemiconductor DevicesComplementary Metal-oxide-semiconductor TechnologyDevice CharacterizationNoiseNoise In Analog CircuitsNoise In Electronic DevicesNoise In Semiconductor DevicesIntegrated Circuit NoiseLow-frequency NoiseMosfet NoiseNoise Analysis In Integrated CircuitsNoise In Field-effect TransistorsNoise In Metal-oxide-semiconductor Field-effect TransistorsNoise In Power Semiconductor DevicesOvershoot
Low-frequency (LF) noise overshoot has been empirically correlated with the frequency dependence of the kink effect in floating body SOI MOSFETs. Based on the correlation between these unique ac characteristics in SOI, a new mechanism is proposed to explain the well-known kink-related noise overshoot. Also, device solutions for suppressing LF noise overshoot will be discussed.
7
Extended study of crosstalk in SOI-SIMOX substrates
A. Viviani, Jean‐Pierre Raskin, Denis Flandre et al. · 2002 · 35 citations
Analogue design issues for SOI CMOS
W. Redman-White, B.M. Tenbroek, M.S.L. Lee et al. · 2002 · 28 citations
Noise overshoot at drain current kink in SOI MOSFET
J. Chen, Peng Fang, P.K. Ko et al. · 2002 · 27 citations
Engineering, Electrical Engineering, Electronic Materials +16