IEEE Transactions on Nuclear Science · 2006 · 14 citations · 8 references
EngineeringAerospace EngineeringComputer EngineeringFault ToleranceFault-tolerant ComputingRadiation MeasurementDevice CharacterizationError CorrectionError DetectionMemory DevicesMemory ModelingDynamic Random-access MemoryIonizing IrradiationMemory ReliabilityNonvolatile Memory DevicesRadiation Environment AnalysisRadiation TestingSingle Event EffectsTotal Ionizing Dose Effects
To evaluate the characteristics of commercial memory devices for space use, the Japan Aerospace Exploration Agency (JAXA) launched a Solid State Recorder (SSR) on the Mission Demonstration test Satellite-1 (MDS-1 or 'Tsubas') into geo-stationary transfer orbit (GTO) in February 2002. Passing through the radiation belt exposed the MDS-1 to severe radiation environment in every orbit. This flight experiment allowed the observation of Single-Event Upsets (SEU) and Total Ionizing Dose (TID) effect on a large number of stacked 64 Mbit Dynamic Random Access Memories (DRAM). As a result, the actual SEU rates could be calculated, and the capabilities of two types of on-the-fly Error Detection and Correction (EDAC) mechanisms were confirmed. This paper presents the results of the space experiment of SSR, focusing especially on SEU analysis
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