Journal of The Electrochemical Society · 2011 · 127 citations · 19 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationSemiconductor MaterialsThin FilmsChemical Vapor DepositionEpitaxial GrowthOptical Thin FilmsSemiconductor Thin FilmsThin-film DepositionThin-film MaterialsAluminum NitrideCrystalline StructureEpitaxial Film GrowthEpitaxial MaterialsEpitaxial Thin FilmsMetal-organic Chemical Vapor DepositionOptical CharacterizationThin-film Optical Characterization
AlN and AlGaN epitaxial films were deposited by metal organic chemical vapor deposition on single crystal AlN substrates processed from AlN boules grown by physical vapor transport. Structural, chemical, and optical characterization demonstrated the high crystalline quality of the films and interfaces.
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X-ray diffraction of III-nitrides
M. A. Moram, M. E. Vickers · Reports on Progress in Physics · 2009 · 1.1K citations
Capillary equilibria of dislocated crystals
F. C. Frank · Acta Crystallographica · 1951 · 622 citations
Seeded growth of AlN bulk crystals in m- and c-orientation
Peng Lu, Ramón Collazo, Rafael Dalmau et al. · Journal of Crystal Growth · 2009 · 138 citations
Natural Sciences, Materials Engineering, Materials Science +13