An integrated framework for yield management and defect/fault reduction

Charles M. Weber, B. Moslehi, Mihir Dutta

IEEE Transactions on Semiconductor Manufacturing · 1995 · 35 citations · 18 references

Concepts

Abstract

An integrated framework for yield management and defect/fault reduction is presented. A 3D space consisting of a quality axis, a process integration axis, and a scaling axis encompasses all process and manufacturing parameters. Cross-functional teams of process, equipment, operations, and materials personnel proactively explore this space, and provide process engineers with a stable and capable environment for process development and manufacturing activities.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

References

18