Coupling capacitances for two-dimensional wires

R. Dang, N. Shigyo

IEEE Electron Device Letters · 1981 · 57 citations · 0 references

Concepts

Abstract

This letter reports some interesting results on the two-dimensional effects of the capacitances of LSI metallic interconnect wires, based on a numerical analysis of the Laplace's equation. Our findings show that there exists an optimum condition for the relation between line-and-space and coupling capacitances.