Molecular resolution imaging of C<sub>60</sub>on Au(111) by non-contact atomic force microscopy

Jeffrey M. Mativetsky, Sarah A. Burke, R. Hoffmann, Yan Sun, Peter Grütter

Nanotechnology · 2004 · 25 citations · 19 references

Concepts

Abstract

Non-contact atomic force microscopy (NC-AFM) was used to study thin films of C60 on Au(111). After observing the Au(111) reconstruction, 2–3 monolayers of C60 were deposited onto the Au surface. The close-packed C60 surface was imaged by NC-AFM with molecular resolution. Enhanced corrugation and a stretching of the C60 lattice were observed at step edges. Based on a calculation of the force required to displace an edge molecule, it is proposed that the edge effects are a result of tip-induced displacements of edge molecules. While imaging small clusters of C60, some molecules were removed, leading to structural rearrangements of the clusters.

References

19