Nanotechnology · 2004 · 25 citations · 19 references
Natural SciencesMaterials SciencePhysicsNanotechnologySurface ChemistrySurface ScienceAtomic Force MicroscopyMolecular StructureNanostructured SurfacesScanning Probe MicroscopySurface MicroscopySurface PhysicsAtomic Force Microscopy Image ResolutionAtomic-scale Surface ImagingCorrugationImaging ResolutionNoncontact Atomic Force MicroscopyStep EdgesSurface Topography MappingTip-sample Interactions
Non-contact atomic force microscopy (NC-AFM) was used to study thin films of C60 on Au(111). After observing the Au(111) reconstruction, 2–3 monolayers of C60 were deposited onto the Au surface. The close-packed C60 surface was imaged by NC-AFM with molecular resolution. Enhanced corrugation and a stretching of the C60 lattice were observed at step edges. Based on a calculation of the force required to displace an edge molecule, it is proposed that the edge effects are a result of tip-induced displacements of edge molecules. While imaging small clusters of C60, some molecules were removed, leading to structural rearrangements of the clusters.
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Johannes V. Barth, Harald Brune, G. Ertl et al. · Physical review. B, Condensed matter · 1990 · 1.3K citations · Full text
Properties of large organic molecules on metal surfaces
Federico Rosei, M. Schunack, Yoshitaka Naitoh et al. · Progress in Surface Science · 2003 · 433 citations
Quantitative Measurement of Short-Range Chemical Bonding Forces
Mark A. Lantz, Hans J. Hug, R. Hoffmann et al. · Science · 2001 · 419 citations
Natural Sciences, Chemistry, Physics +17