Surface Topography Mapping

Surface Topography Mapping is a measurement methodology in atomic force microscopy that characterizes the three-dimensional nanoscale morphology of a sample surface by systematically scanning a probe tip across the surface and recording vertical deflections induced by interatomic forces.

1.7K

Publications

107.8K

Citations

5.3K

Authors

1.2K

Institutions

Publications per year

2017–2026

221

Authors

5.3K

  1. SM
    Seizo Morita

    The University of Osaka, Japan

    23 publications · 601 citations

    16

    h-index

  2. YS
    Yasuhiro Sugawara

    The University of Osaka, Japan

    21 publications · 684 citations

    15

    h-index

  3. HY
    Hirofumi Yamada

    Kyoto University, Japan

    16 publications · 860 citations

    15

    h-index

  4. HŌ
    Hiroshi Ōnishi

    Kobe University, Japan

    16 publications · 514 citations

    14

    h-index

  5. PK
    Paul K. Hansma

    University of California, Santa Barbara, United States

    14 publications · 2K citations

    13

    h-index

1–5 of 5.3K

Venues

  1. Applied Physics Letters

    123 publications · 10.9K citations

    55

    h-index

  2. Surface Science

    64 publications · 4.8K citations

    33

    h-index

  3. Nanotechnology

    73 publications · 2.5K citations

    29

    h-index

  4. Review of Scientific Instruments

    51 publications · 2K citations

    27

    h-index

  5. Langmuir

    35 publications · 2.7K citations

    26

    h-index

1–5