Surface Topography Mapping
Surface Topography Mapping is a measurement methodology in atomic force microscopy that characterizes the three-dimensional nanoscale morphology of a sample surface by systematically scanning a probe tip across the surface and recording vertical deflections induced by interatomic forces.
1.7K
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2017–2026
221
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G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text
Surface Studies by Scanning Tunneling Microscopy
G. Binnig, H. Rohrer, Ch. Gerber et al. · Physical Review Letters · 1982 · 4.6K citations · Full text
Richard D. Piner, Jin Zhu, Feng Xu et al. · Science · 1999 · 3K citations
Natural Sciences, Materials Engineering, Materials Science +15
M. Nonnenmacher, M. O’Boyle, H. K. Wickramasinghe · Applied Physics Letters · 1991 · 2.3K citations
Natural Sciences, Materials Engineering, Materials Science +17
Advances in atomic force microscopy
Franz J. Gießibl · Reviews of Modern Physics · 2003 · 2.2K citations · Full text
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Centre National de la Recherche Scientifique
Paris, France
28 h-index
197 publications
8.6K citations
The University of Osaka
Osaka, Japan
22 h-index
170 publications
5.4K citations
The University of Tokyo
Tokyo, Japan
20 h-index
67 publications
3K citations
Stanford University
Stanford, United States
19 h-index
58 publications
47.9K citations

Tohoku University
Sendai, Japan
19 h-index
96 publications
3K citations

Kyoto University
Kyoto, Japan
18 h-index
93 publications
7.3K citations

Chinese Academy of Sciences
Beijing, China
18 h-index
100 publications
2.8K citations
University of Cambridge
Cambridge, United Kingdom
17 h-index
44 publications
1.8K citations
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123 publications · 10.9K citations
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64 publications · 4.8K citations
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73 publications · 2.5K citations
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51 publications · 2K citations
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35 publications · 2.7K citations
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