Atomic-scale Surface Imaging

Atomic-Scale Surface Imaging is a computational and experimental methodology within surface science that enables the visualization and analysis of atomic arrangements and structural dynamics at semiconductor interfaces with sub-angstrom spatial resolution, utilizing techniques such as scanning tunneling microscopy and atomic force microscopy to directly resolve lattice configurations and surface reconstructions.

2.4K

Publications

154K

Citations

7.1K

Authors

1.2K

Institutions

Publications per year

2017–2026

239

Authors

7.1K

  1. YH
    Yukio Hasegawa

    The University of Tokyo, Japan

    20 publications · 966 citations

    18

    h-index

  2. FB
    Flemming Besenbacher

    Aarhus University, Denmark

    20 publications · 1.8K citations

    18

    h-index

  3. YS
    Yasuhiro Sugawara

    The University of Osaka, Japan

    27 publications · 1.1K citations

    17

    h-index

  4. FJ
    Franz J. Gießibl

    University of Regensburg, Germany

    16 publications · 5K citations

    16

    h-index

  5. AS
    Adam S. Foster

    Aalto University, Finland

    16 publications · 1.6K citations

    16

    h-index

1–5 of 7.1K

Venues

  1. Physical Review Letters

    PRL · 109 publications · 33.6K citations

    68

    h-index

  2. Physical review. B, Condensed matter

    PRB · 146 publications · 9.8K citations

    59

    h-index

  3. Surface Science

    203 publications · 9.2K citations

    51

    h-index

  4. Applied Physics Letters

    136 publications · 6.3K citations

    44

    h-index

  5. Ultramicroscopy

    91 publications · 4.4K citations

    34

    h-index

1–5