IEEE Transactions on Nuclear Science · 2011 · 52 citations · 6 references
EngineeringAerospace EngineeringElectrical EngineeringMicroelectronicsRadiation MeasurementSemiconductor DevicesDetector TechnologyDevice CharacterizationSatellite InstrumentationSatellite OrbitsSpacecraft TestComponent-level Radiation TestingFlight ConditionsGround TestingOperational ConditionsRadiation EffectsRadiation TestingSemiconductor Radiation DetectorsTest Instrumentation
As a semiconductor component radiation effects and technology demonstration experiment, the Technology Demonstration Module (TDM) integrated into the PROBA-II satellite, was launched on November 2nd 2009, into a 800 km polar orbit. This SEU/SEL experiment, in strong support to the Reference SEU Monitor database , will be described and details given about ground testing and calibrations. Since ground testing was carried out on flight lot devices and under flight operational conditions, the in-orbit SEU/SEL database will eventually become a vital reference point for improved modeling, prediction and testing. Evidence to confirm this promise is starting to emerge and will be presented at the end of the paper. As the present in-orbit number of events is still small, only the first month of flight performance will be presented with strong emphasis on validating correct operation of monitored devices.
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TID and SEE Tests of an Advanced 8 Gbit NAND-Flash Memory
H. Schmidt, D. Walter, F. Gliem et al. · 2008 · 49 citations
Laser SEE Sensitivity Mapping of SRAM Cells
Andrew Michael Chugg, Andrew J. Burnell, M. J. Moutrie et al. · IEEE Transactions on Nuclear Science · 2007 · 24 citations