IEEE Transactions on Instrumentation and Measurement · 2001 · 14 citations · 5 references
EngineeringElectrical EngineeringPhysicsMicroelectronicsPlasma PhysicsSemiconductor DevicesElectric FieldsElectrical System DiagnosticsElectrostatic DischargeElectrostatic Discharge TestingPulse CharacteristicsTransmission Line TheoryTransmission Line Transients
Transmission line pulsing (TLP) is a useful technique to characterize electrostatic discharge (ESD) events in semiconductor devices. The pulse waveforms generated by a typical TLP setup, however, are often distorted and oscillatory. In this paper, a new and simple experimental setup is developed to improve the shape of the TLP waveforms and thus to increase the effectiveness of the TLP technique. Experimental results obtained from the conventional and improved setups are presented and compared.
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ESD in silicon integrated circuits
Microelectronics Reliability · 1996 · 442 citations
Influence of gate length on ESD-performance for deep sub micron CMOS technology
Karlheinz Bock, B. Keppens, V. De Heyn et al. · 2003 · 37 citations