J.J. Liou

Semiconductor devices for RF applications: evolution and current status

Frank Schwierz, J.J. Liou · Microelectronics Reliability · 2001 · 67 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

Development of robust interconnect model based on design of experiments and multiobjective optimization

Qiang Zhang, J.J. Liou, John McMacken et al. · IEEE Transactions on Electron Devices · 2001 · 53 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Determination of lifetime and surface recombination velocity of p-n junction solar cells and diodes by observing transients

F.A. Lindholm, J.J. Liou, A. Neugroschel et al. · IEEE Transactions on Electron Devices · 1987 · 30 citations

Engineering, Electrical Engineering, Materials Science +17

Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors

Hei Wong, Yue Fu, J.J. Liou et al. · Microelectronics Reliability · 2008 · 14 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

An improved experimental setup for electrostatic discharge (ESD) measurements based on transmission line pulsing technique

Jui-Chu Lee, Robert A. Young, J.J. Liou et al. · IEEE Transactions on Instrumentation and Measurement · 2001 · 14 citations · Full text

Engineering, Electrical Engineering, Physics +10