2002 · 30 citations · 8 references
EngineeringComputer EngineeringElectrical EngineeringComputer ArchitectureSystem-on-chip DesignBuilt-in Self-testDesign For TestabilityDevice ReliabilityHardware DebuggingHardware-in-the-loop TestingInstruction Set ArchitectureBuilt-in TestBuilt-in Test ArchitectureElectrical TestabilityManufacturabilityManufacturability ConstraintsTest DesignTestabilityTestability Engineering
This paper describes the testability strategy and design-for-test features of the Alpha AXP 21164 microprocessor. It discusses the specific testability and manufacturability issues of the chip and the innovative solutions employed to solve them.
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A Fault-Driven, Comprehensive Redundancy Algorithm
John Day · IEEE Design & Test of Computers · 1985 · 132 citations
Minimum fault coverage in reconfigurable arrays
Test features of the HP PA7100LC processor
D. Josephson, Doug Dixon, B. Arnold · 2002 · 33 citations