Publication | Closed Access
Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy
36
Citations
27
References
2011
Year
Materials ScienceNanoscale ScienceEngineeringStrain AnalysisNanomaterialsNanotechnologySpectroscopyMicroscopyApplied PhysicsTip-enhanced Raman SpectroscopySurface-enhanced Raman ScatteringScanning Probe MicroscopyNanometrologyNano-scale Sige StructuresSpectroscopic Method
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