Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy

Péter Hermann, M. Hecker, Dmytro Chumakov, Martin Weisheit, Jochen Rinderknecht, Artem Shelaev, Pavel Dorozhkin, Lukas M. Eng

Ultramicroscopy · 2011 · 36 citations · 27 references

Concepts

References

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