Nanometrology

Nanometrology is the academic field of metrology specializing in the science, methodology, and practice of measurement at the nanoscale, distinguished by its focus on quantifying physical dimensions, properties, and phenomena with nanometer-level precision and traceability.

439

Publications

29.3K

Citations

1.3K

Authors

504

Institutions

Publications per year

2017–2026

75

Authors

1.3K

  1. LK
    Ludger Koenders

    Physikalisch-Technische Bundesanstalt, Germany

    9 publications · 411 citations

    9

    h-index

  2. AY
    Andrew Yacoot

    National Physical Laboratory, United Kingdom

    8 publications · 369 citations

    8

    h-index

  3. MC
    Mihail C. Roco

    U.S. National Science Foundation, United States

    6 publications · 420 citations

    7

    h-index

  4. GD
    Gaoliang Dai

    Physikalisch-Technische Bundesanstalt, Germany

    6 publications · 208 citations

    6

    h-index

  5. CL
    Clifford Lau

    Institute For Defense Analyses, United States

    6 publications · 512 citations

    6

    h-index

1–5 of 1.3K

Venues

  1. Measurement Science and Technology

    23 publications · 1K citations

    19

    h-index

  2. Journal of Nanoparticle Research

    22 publications · 1.7K citations

    18

    h-index

  3. Scientometrics

    11 publications · 997 citations

    12

    h-index

  4. Nanotechnology

    11 publications · 517 citations

    11

    h-index

  5. Metrologia

    11 publications · 264 citations

    10

    h-index

1–5