Concepedia

ESD protection to overcome internal gate-oxide damage on digital-analog interface of mixed-mode CMOS IC's

Ming‐Dou Ker, Ta-Lee Yu

Microelectronics Reliability · 1996 · 29 citations · 3 references

DOI

Concepts

References

3

Internal chip ESD phenomena beyond the protection circuit

C. Duvvury, R.N. Rountree, Oliver Adams · IEEE Transactions on Electron Devices · 1988 · 75 citations

, , +8

Complementary-LVTSCR ESD protection circuit for submicron CMOS VLSI/ULSI

Ming-Dou Ker, Chung‐Yu Wu, Hun-Hsien Chang · IEEE Transactions on Electron Devices · 1996 · 67 citations

, , +9

Influence of the series resistance of on-chip power supply buses on internal device failure after ESD stress (MOS devices)

H. Terletzki, W. Nikutta, W. Reczek · IEEE Transactions on Electron Devices · 1993 · 45 citations

, , +14