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In-situ X-ray imaging of III–V strained-layer relaxation processes

C. R. Whitehouse, A.G. Cullis, S. J. Barnett, B. F. Usher, G. F. Clark, A.M. Keir, B. K. Tanner, B. Lunn, Jabez Hogg, A. D. Johnson,

Journal of Crystal Growth · 1995 · 35 citations · 9 references

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References

9

Defects in epitaxial multilayers I. Misfit dislocations

Jacqueline M. Matthews · Journal of Crystal Growth · 1974 · 3.1K citations

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Synchrotron-radiation plane-wave topography I. Application to misfit dislocation imaging in III-V heterojunctions

J. F. Pétroff, M. Sauvage, P. Riglet et al. · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1980 · 89 citations

, , +17

Misfit dislocation characteristics in quarternary heterojunctions Ga1-xAlxAs1-yPy/GaAs analysed by synchrotron radiation white beam topography

J. F. Pétroff, M. Sauvage · Journal of Crystal Growth · 1978 · 78 citations

, , +16

Microscopy of semiconducting materials

Stephen J. Pennycook · 1991 · 45 citations

, , +10

X-ray topography of the coherency breakdown in Ge<i>x</i>Si1−<i>x</i>/Si(100)

D. J. Eaglesham, E. P. Kvam, D. M. Maher et al. · Applied Physics Letters · 1988 · 41 citations

, , +17