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Misfit dislocation characteristics in quarternary heterojunctions Ga1-xAlxAs1-yPy/GaAs analysed by synchrotron radiation white beam topography

EngineeringDislocation InteractionPhysicsApplied PhysicsCondensed Matter PhysicsMisfit Dislocation CharacteristicsDefect FormationMolecular Beam EpitaxySynchrotron RadiationQuarternary Heterojunctions Ga1-xalxas1-ypy/gaas