Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1980 · 89 citations · 17 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureElectronic MaterialsOpticsCrystallographyDislocations In SemiconductorsIii-v SemiconductorsSemiconductor DefectsSemiconductor HeterostructuresX-ray DiffractionDislocation Contrast ImagingHeterojunctionsHeterostructure DevicesHeterostructuresMisfit DislocationsSemiconductor HeterojunctionsStrain EffectsX-ray Topography
The extremely parallel and monochromatic beam (divergence ∼ 0·3″, spectral width Δλ/λ ∼ 7 × 10−6) extracted from the white synchrotron-radiation X-ray beam by a multiple reflection single-crystal monochromator has been used to record plane-wave reflection topographs. Separate images of a quaternary epilayer, Ga0.7Al0.3As1-yPy and a GaAs substrate building up a nearly matched heterostructure have been obtained. Typical thin-crystal features are observed in the epilayer. Differences in the interface dislocation contrast and strain field are revealed between the layer and substrate. By increasing the local departure from Bragg incidence (weak-beam condition), images as narrow as 1 μm can be obtained.
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The Theory of X-ray Diffraction in Crystals.
W. H. Zachariasen · The Journal of Physical Chemistry · 1946 · 839 citations