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Proton energy dependence of the light output in gallium nitride light-emitting diodes
40
Citations
13
References
2004
Year
Wide-bandgap SemiconductorEngineeringLight-emitting DiodesGallium NitridePhotonicsElectrical EngineeringPhotoluminescencePhysicsNew Lighting TechnologyAluminum Gallium NitrideProton Energy DependenceCategoryiii-v SemiconductorRoom TemperatureLight OutputSolid-state LightingApplied PhysicsGan Power DeviceProton EnergyOptoelectronics
Gallium nitride (GaN)-based blue-emitting diodes (CREE Model C430-DH85) were irradiated at room temperature with protons in the energy range 2 to 115 MeV at fluences varying from 1/spl times/10/sup 11/ to 1/spl times/10/sup 15/ cm/sup -2/. Light output degradation curves were obtained for each energy and the damage constant (A) associated with these curves was determined according to the theory of Rose and Barnes. For proton energies less than 10 MeV, A varies inversely with the proton energy (E). At higher energies, A is consistently above the 1/E relationship. The change in nature of the energy dependence is attributed to nuclear interactions. Nonionizing energy loss calculations for the case of protons on GaN are presented. Good agreement between theory and experiment is obtained.
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