Characterization of normally-off SiC vertical JFET devices and inverter circuits

Jih‐Sheng Lai, Hao Yu, J. Zhang, Peter Alexandrov, Y. Li, J.H. Zhao, Kuang Sheng, Allen R. Hefner

Fourtieth IAS Annual Meeting. Conference Record of the 2005 Industry Applications Conference, 2005. · 2005 · 26 citations · 4 references

Concepts

Abstract

A latest developed normally-off SiC JFETs has been characterized under static and dynamic operating conditions. Two application oriented inverter circuits were constructed for additional tests under and soft- and hard-switching conditions. The single-phase soft-switching inverter was running at 100 kHz, and the three-phase hard-switching inverter was running at 15 kHz. The unique feature of the inverter operating in synchronous rectification mode has been observed. Without synchronous rectification, the freewheeling diode voltage drop is a fixed voltage plus a resistive voltage. The fixed voltage at zero current is about 1 V for the tested SiC Schottky diodes, and the resistive voltage drop portion is highly dependent on the temperature. With synchronous rectification, the voltage drop is the product of the on-drop resistance and the drain current of the JFET, which can be controlled with the chip area. In the experimental case, the measured voltage drop was 1 V with JFET conducting in reverse direction and 2 V with diode forward conducting. Thus the new generation SiC VJFET device allows high-efficiency inverter operation with reduction of the conduction loss by synchronous rectification and the reduction of switching loss with soft switching.

References

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