A pragmatic test and diagnosis methodology for partially testable MCMs

Abstract

Current MCM market cannot afford yet 100% product testability. This paper presents a way to get along with partial testability. Under the assumption that module-level boundary scan is available and that, at the chip-level, it is only implemented in some of the dies, we propose a methodology for simultaneous test and diagnosis of boundary scan and non boundary scan parts.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>