Evaluation of SEU and crosstalk effects in network-on-chip switches

Abstract

As the complexity of designs increases and the technology scales down into the deep sub-micron domain, devices and interconnections are subject to new types of malfunctions and failures. This work intends to evaluate the effect of Single Event Upsets (SEUs) and crosstalk faults in a Network-on-Chip switch by performing fault injection simulations, allowing an accurate analysis of the impact of these faults over the switch service. The results show that such faults might affect the switch behavior, with errors ranging from simple loss of packets up to the permanent interruption of the switch service.