Height anomalies in tapping mode atomic force microscopy in air caused by adhesion - Concepedia

Concepedia

Publication | Open Access

Height anomalies in tapping mode atomic force microscopy in air caused by adhesion

DOI Full Paper Access

140

Citations

19

References

1997

Year

S.J.T. van Noort, Kees O. van der Werf, B.G. de Grooth, N.F. van Hulst, Jan Greve

Ultramicroscopy

EngineeringMicrofabricationMechanicsMicroscopyMechanical EngineeringSurface ScienceApplied PhysicsMicroscopy MethodScanning Force MicroscopyScanning Probe MicroscopyNanometrologyHeight AnomaliesNanotribology

References

	Year	Citations

Page 1

Page 1