Tapping Mode Atomic Force Microscopy

Tapping Mode Atomic Force Microscopy is a dynamic atomic force microscopy technique in which the cantilever oscillates near its resonance frequency and intermittently contacts the sample surface, thereby reducing lateral forces and minimizing sample damage compared to contact mode.

718

Publications

49.9K

Citations

2.2K

Authors

596

Institutions

Publications per year

2017–2026

50

Variants

Intermittent Contact Mode AfmIntermittent Contact Mode Atomic Force MicroscopyTapping Mode Afm

Authors

2.2K

  1. GB
    G. Bar

    University of Freiburg, Germany

    14 publications · 1.1K citations

    14

    h-index

  2. MW
    Myung‐Hwan Whangbo

    North Carolina State University, United States

    14 publications · 2.1K citations

    14

    h-index

  3. JP
    J. P. Cleveland

    University of California, Santa Barbara, United States

    14 publications · 3.4K citations

    13

    h-index

  4. RB
    Rainer Brandsch

    North Carolina State University, United States

    12 publications · 971 citations

    12

    h-index

  5. SO
    S. O. Reza Moheimani

    University of Newcastle Australia, Australia

    11 publications · 330 citations

    11

    h-index

1–5 of 2.2K

Venues

  1. Langmuir

    84 publications · 8.3K citations

    45

    h-index

  2. Applied Physics Letters

    56 publications · 6.7K citations

    36

    h-index

  3. Review of Scientific Instruments

    39 publications · 2.3K citations

    25

    h-index

  4. Macromolecules

    24 publications · 1.5K citations

    20

    h-index

  5. Journal of Applied Physics

    25 publications · 1.7K citations

    19

    h-index

1–5