G. Bar

Factors Affecting the Height and Phase Images in Tapping Mode Atomic Force Microscopy. Study of Phase-Separated Polymer Blends of Poly(ethene-<i>co</i>-styrene) and Poly(2,6-dimethyl-1,4-phenylene oxide)

G. Bar, Yi Thomann, Rainer Brandsch et al. · Langmuir · 1997 · 318 citations

Engineering, Microscopy, Tip−sample Force +20

On the Factors Affecting the Contrast of Height and Phase Images in Tapping Mode Atomic Force Microscopy

Rainer Brandsch, G. Bar, Myung‐Hwan Whangbo · Langmuir · 1997 · 161 citations

Engineering, Microscopy, Surface Nanotechnology +22

Characterization of the Morphologies and Nanostructures of Blends of Poly(styrene)-<i>block</i>-poly(ethene-<i>co</i>-but-1-ene)-<i>block</i>-poly(styrene) with Isotactic and Atactic Polypropylenes by Tapping-Mode Atomic Force Microscopy

G. Bar, Yi Thomann, Myung‐Hwan Whangbo · Langmuir · 1998 · 120 citations

Engineering, Microscopy, Mechanical Engineering +21

Dendrimer-Modified Silicon Oxide Surfaces as Platforms for the Deposition of Gold and Silver Colloid Monolayers:  Preparation Method, Characterization, and Correlation between Microstructure and Optical Properties

G. Bar, Shai Rubin, Russell W. Cutts et al. · Langmuir · 1996 · 110 citations

Nanoparticles, Engineering, Nanostructured Surface +23

Latex Blends of Fluorinated and Fluorine-Free Acrylates:  Emulsion Polymerization and Tapping Mode Atomic Force Microscopy of Film Formation

Reinhard Linemann, Thomas E. Malner, Rainer Brandsch et al. · Macromolecules · 1999 · 95 citations