Factors Affecting the Height and Phase Images in Tapping Mode Atomic Force Microscopy. Study of Phase-Separated Polymer Blends of Poly(ethene-<i>co</i>-styrene) and Poly(2,6-dimethyl-1,4-phenylene oxide)

Abstract

Blends of two polymers, poly(ethene-co-styrene) (PES) and poly(2,6-dimethyl-1,4-phenylene oxide) (PPO), were examined with tapping mode atomic force microscopy (AFM) using various values of the driving amplitude A0 and set-point amplitude ratio rsp = Asp/A0, where Asp is the set-point amplitude. In height and phase images of PPO/PES blend samples, the relative contrast of chemically different regions depends sensitively on the rsp and A0 values. As the tip−sample force is increased from small to large, both phase and height images of PPO/PES blend samples can undergo a contrast reversal twice. This makes it difficult to assign the features of height and phase images to different chemical components without performing additional experiments. Phase and height images were interpreted by analyzing several factors that affect the dependence of phase shift and amplitude damping on rsp and A0.