Tip-sample Adhesion

Tip-Sample Adhesion is a nanoscale interfacial force phenomenon, belonging to the category of atomic force microscopy (AFM) tip–surface interactions, that specifically arises from attractive molecular or electrostatic forces between the AFM probe tip and the sample surface during approach and retraction cycles.

1.6K

Publications

100.3K

Citations

4.8K

Authors

1.1K

Institutions

Publications per year

2017–2026

163

Authors

4.8K

  1. YY
    Yongda Yan

    Harbin Institute of Technology, China

    19 publications · 640 citations

    18

    h-index

  2. BB
    Bharat Bhushan

    The Ohio State University, United States

    15 publications · 1K citations

    14

    h-index

  3. EM
    Ernst Meyer

    University of Basel, Switzerland

    18 publications · 1.6K citations

    14

    h-index

  4. HB
    Hans‐Jürgen Butt

    Max Planck Institute for Polymer Research, Germany

    13 publications · 1.7K citations

    13

    h-index

  5. YG
    Yanquan Geng

    Harbin Institute of Technology, China

    12 publications · 397 citations

    12

    h-index

1–5 of 4.8K

Venues

  1. Langmuir

    121 publications · 9K citations

    51

    h-index

  2. Applied Physics Letters

    72 publications · 7.2K citations

    39

    h-index

  3. Ultramicroscopy

    89 publications · 3.5K citations

    34

    h-index

  4. Physical review. B, Condensed matter

    PRB · 39 publications · 5.3K citations

    30

    h-index

  5. Nanotechnology

    57 publications · 2.4K citations

    27

    h-index

1–5