Hydrogenation of polycrystalline silicon thin film transistors by plasma ion implantation

J.D. Bernstein, Shu Qin, Tsu-Jae King

IEEE Electron Device Letters · 1995 · 59 citations · 13 references

Concepts

Abstract

Both n- and p-channel polycrystalline silicon (poly-Si) thin film transistors (TFT's) have been hydrogenated using the plasma ion implantation (PII) technique. Significant improvements in device characteristics have been obtained. Because PII is capable of greater dose rates than plasma immersion, it allows for significantly shorter process times than other methods investigated thus far.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

References

13