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Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation

Atomic Force MicroscopyEngineeringElectron MicroscopyPhysicsMicroscopyNanotechnologyMicroscopy MethodScanning Probe MicroscopyApplied PhysicsHookian ApproximationScanning Force MicroscopyNanofabricationLight MicroscopyMedicineBiophysics