IEEE Transactions on Electron Devices · 2001 · 111 citations · 36 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice ModelingField-effect TransistorsIii-v SemiconductorsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsCurrent Flow ModelingGrowth DirectionsHeterojunction DevicesHeterojunctionsPoisson EquationPolarization EffectsSemiconductor Device ModelingSemiconductor Heterojunctions
We report on the calculation of electrical characteristics of AlGaN/GaN heterojunction field effect transistors (HFETs). The model is based on the self-consistent solution of the Schrodinger and Poisson equations coupled to a quasi-2D model for the current flow. Both single and double heterojunction devices are analyzed for [0001] or [000-1] growth directions. The onset of a parasitic p-channel for particular growth directions and alloy concentrations is also shown.
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GaN: Processing, defects, and devices
S. J. Pearton, J.C. Zolper, R. J. Shul et al. · Journal of Applied Physics · 1999 · 1.8K citations
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