The P1149.4 Mixed Signal Test Bus: costs and benefits

Abstract

This paper summarizes key elements of the proposed IEEE P1149.4 Mixed-Signal Test Bus Standard, examines costs and benefits in detail, and includes specific circuit examples. The significant costs are silicon area and pins. Benefits include test cost reduction, diagnosability, and unique capabilities. Changes proposed since ITC'93 and areas of controversy are noted for this un-released standard.