J.E. McDermid

Structure and metrology for an analog testability bus

Kenneth P. Parker, J.E. McDermid, Stig Oresjo · 2002 · 69 citations

Engineering, Measurement, Computer Architecture +17

Inductorless Bandpass Characteristics Using All-Pass Networks

Douglas E. Comer, J.E. McDermid · IEEE Transactions on Circuit Theory · 1968 · 36 citations

Electrical Engineering, Engineering, Bandpass Filters +12

Limited access testing: IEEE 1149.4-instrumentation and methods

J.E. McDermid · 2002 · 15 citations

Engineering, Measurement, Information Security +23

IEEE-1149.x standards: achievements vs. expectations

Louis Y. Ungar, Harry Bleeker, J.E. McDermid et al. · 2002 · 15 citations

Engineering, Measurement, System Level Testability +21

Design, fabrication and use of mixed-signal IC testability structures

Kenneth P. Parker, J.E. McDermid, R.A. Browen et al. · 2002 · 14 citations

Engineering, Vlsi Design, Computer Architecture +16