2004 · 23 citations · 26 references
ComputingComputer EngineeringComputer ScienceCompilersData StructuresReconfigurable ComputingCoding TheoryData CompressionHardware AccelerationLossy Data CompressionCompressionCompression Performance EvaluationCompression TechniquesDictionary CodingTest Compression
In this paper we describe a method to combine dictionary coding and partial LFSR reseeding to improve the ompression efficiency for test data compression. We also present a fast matrix calculation method which significantly reduces the computation time to find a solution for partial LFSR reseeding. Experimental results on ISCAS89 benchmark circuits show that our approach is better than either dictionary coding or LFSR reseeding, and outperforms several test data compression methods proposed recently.
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LFSR-coded test patterns for scan designs
B. Koenemann · Medical Entomology and Zoology · 1991 · 510 citations
Test set compaction algorithms for combinational circuits
İlker Hamzaoğlu, J.H. Patel · 1998 · 432 citations · Full text
Embedded deterministic test for low cost manufacturing test
J. Rajski, Jerzy Tyszer, Mark Kassab et al. · 2003 · 402 citations
Engineering, Computer Engineering, Electrical Engineering +13