2010 · 25 citations · 2 references
EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsTest DevelopmentBuilt-in Self-testDefect CharacterizationDefectsDesign For TestabilityDevice CharacterizationStructural TestingAnalog TestabilityBuilt-in Self-test For Analog CircuitsElectrical TestabilityHardware DiagnosticsHardware Fault Models
Production testing of today's RF SoCs does not require expensive conventional tests. We propose a set of defect based tests for the RF/Analog sections, based on our analysis of defects that occur in a modern RFCMOS process.
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