Breakdown Degradation Associated With Elementary Screw Dislocations In 4H-SiC P⁺N Junction Rectifiers

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M. Bhatnagar, B. Jayant Baliga · IEEE Transactions on Electron Devices · 1993 · 1.1K citations

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David Larkin, Philip G. Neudeck, J. A. Powell et al. · Applied Physics Letters · 1994 · 321 citations

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Performance limiting micropipe defects in silicon carbide wafers

Philip G. Neudeck, J. A. Powell · IEEE Electron Device Letters · 1994 · 307 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

Conductivity Anisotropy in Epitaxial 6H and 4H Sic

W. J. Schaffer, Gerry Negley, K. G. Irvine et al. · MRS Proceedings · 1994 · 289 citations

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