IEEE Photonics Technology Letters · 2010 · 24 citations · 16 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDetector TechnologyIon ImplantationOptoelectronic DevicesPhotodetectorsSemiconductor DetectorsSemiconductor Device MaterialsAvalanche Photodiode DetectorsAvalanche PhotodiodesDark Current ReductionExternal Quantum EfficiencyPhotodetectionPhotodiodesQuantum EfficiencySilicon Carbide (Sic) Materials
We report reach-through structure 4H-SiC avalanche photodiodes isolated by proton implantation. These devices achieved low dark current (85 pA at a gain of 1000) and high external quantum efficiency ( 75% at 260 nm).
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Ionization rates and critical fields in 4H silicon carbide
Andrey O. Konstantinov, Q. Wahab, N. Nordell et al. · Applied Physics Letters · 1997 · 398 citations
John C. Carrano, Damien Lambert, C. J. Eiting et al. · Applied Physics Letters · 2000 · 256 citations
An optimized avalanche photodiode
H. Ruegg · IEEE Transactions on Electron Devices · 1967 · 103 citations