IEEE Transactions on Nuclear Science · 2008 · 79 citations · 20 references
EngineeringElectrical EngineeringDose-response ModelingMicroelectronicsSemiconductor DevicesAbsorbed DoseDose-response AssessmentDose-response RelationshipsLinear Circuit AnalysisLow-dose Radiation EffectsRadiation SensitivityBipolar Cell CircuitsDose-rate EffectsHigh-dose-rate ResponseLow-dose Radiation ResponsesMetal-oxide-semiconductor Field-effect Transistor DosimetryRadiation EffectsRate Sensitivity
It is experimentally demonstrated with test transistors and circuits that hydrogen is correlated with enhanced low dose rate sensitivity (ELDRS) in bipolar linear circuits. These experiments show that the amount of hydrogen determines the total dose response versus dose rate, both the saturation at low dose rate and the transition dose rate between the high and low dose rate responses. The experimental results are supported with modeling calculations using REOS (radiation effects in oxides and semiconductors).
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Response of advanced bipolar processes to ionizing radiation
E.W. Enlow, R.L. Pease, W.E. Combs et al. · IEEE Transactions on Nuclear Science · 1991 · 322 citations
Total dose effects on negative voltage regulator
J. Beaucour, T. Carrière, A. Gach et al. · IEEE Transactions on Nuclear Science · 1994 · 101 citations