Concepedia

Publication | Closed Access

Capacitive RF MEMS analytical predictive reliability and lifetime characterization

DOI

11

Citations

9

References

2009

Year

M. Matmat, Fabio Coccetti, A. Marty, R. Plana, Christophe Escriba, Jean-Yves Fourniols, D. Estève
Microelectronics Reliability

References

YearCitations

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