Development of 157 nm positive resists

Hiroshi Itô, G. M. Wallraff, Nicolette Fender, P. J. Brock, William D. Hinsberg, Arpan P. Mahorowala, Carl E. Larson, Hoa D. Truong, Greg Breyta, Robert D. Allen

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2001 · 33 citations · 17 references

Concepts

Abstract

For adequate transparency we have selected hexafluoroisopropanol as an acid group and an α-trifluoromethylacrylic moiety as a repeat unit of our 157 nm resist polymers. The hexafluoroalcohol group is bound to norbornene or styrene. Four platforms are currently available to us: (1) all-acrylic, (2) all-alicyclic, (3) acrylic-alicyclic, and (4) acrylic-aromatic systems. While the all-alicyclic (all-norbornene) polymers are synthesized by transition-metal-initiated addition polymerization, all other polymers involving α-trifluoromethylacrylic monomers are prepared by conventional radical copolymerization. Characterization of the polymers and preliminary lithographic evaluation are reported.

References

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