Concepedia

Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach

Chris Feige, Jan ten Pierick, Clemens Wouters, R.J.W.T. Tangelder, Hans G. Kerkhoff

Journal of Electronic Testing · 1999 · 14 citations · 2 references

DOI

References

2

AMBA: enabling reusable on-chip designs

David Flynn · IEEE Micro · 1997 · 158 citations

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Testability and test protocol expansion in hierarchical macro testing

Erik Jan Marinissen, K. Kuiper, Clemens Wouters · 2002 · 22 citations

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