Concepedia

Publication | Closed Access

Characterization of different porous silicon structures by spectroscopic ellipsometry

DOI

50

Citations

8

References

1996

Year

M. Fried, T. Lohner, O. Polgár, P. Petrík, É. Vázsonyi, I. Bársony, J.P. Piel, J.L. Stehlé
Thin Solid Films

References

YearCitations

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